NT-MDT Spectrum Instruments
From cutting edge scientific research to routine surface investigations, NT-MDT has a unique and unrivalled portfolio of scanning probe microscopes. Our application-focused instruments provide you with a full range of capabilities in AFM-Raman, high-resolution, multi-frequency measurements, and AFM based nanomechanics. As an innovator in SPM for over 25 years, NT-MDT has a specialized high-performance solution for your research needs.
NT-MDT Spectrum Instruments
AFM and AFM-Raman Solutions for Nanoscale Studies
Kelvin Probe Force Microscopy. AFM Theory from NT-MDT.
ScanT™ - a Shortcut to Reliable AFM Results
TITANIUM - the revolutionary step in AFM design
Challenges and Solutions in Practical Atomic Force Microscopy
Tip Enhanced Raman Scattering. Approaching 10 nm spatial resolution in Raman imaging
Magnetic Force Microscopy – Modern Approaches and Application Examples
Magnetic Force Microscopy – Modern Approaches and Application Examples (Part 2)
AFM imaging of DNA related structures
Raman-AFM & Tip Enhanced Raman Scattering (TERS)
New HD-AFM Mode; Your Path to Controlling Forces for Precise Material Properties
Beyond the Diffraction Limit: AFM Integration with Light
Basic Principles of AFM Advanced Modes & Applications
New Developments in AFM Oscillatory Resonance Modes: Frequency Imaging and Frequency Modulation