AT2 Automated XY Stage | Configured for Flexural Testing of Microelectronics
Автор: Instron
Загружено: 2026-01-15
Просмотров: 51
The Instron® AT2 Automated XY Stage can be installed on any new or existing 6800 and 5900 Series universal testing systems to automate compression, tensile, and flexure testing of devices or components with multiple test points, or multiple components with repetitive test points. These systems are widely adopted in the biomedical and electronics industries to test a wide range of materials, devices, and components.
In this video, the AT2 is configured to perform flexural testing for microelectronics, delivering fast, repeatable flexural testing for microelectronics with hands‑free specimen handling.
KEY SYSTEM FEATURES:
• Integrated JEDEC tray compatibility for streamlined specimen loading and organization
• Vacuum gripper with rotation for precise pick‑and‑place and specimen orientation
• Adjustable fixturing to accommodate various specimen sizes
• Automated specimen ejector for uninterrupted, continuous testing
• Magnetic collection bin for easy removal of tested specimens
LEARN MORE:
AT2 Automated XY Stage:
https://www.instron.com/en/products/t...
Electronics & Microelectronics Testing Solutions:
https://www.instron.com/en/industry-s...
0:12 - System Overview
0:24 - JEDEC Specimen Tray is Loaded
0:30 - Test is Initiated
0:40 - Vacuum Gripper Collects and Orients Specimen
0:50 - Anvil Lowered to Test Specimen
1:11 - Specimen is Ejected
1:18 - Remaining Specimen Tested
1:26 - Magnetic Collection Bin for Easy Specimen Removal
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