Graphene Characterization Methods and Issues - Dr. Andrew Pollard National Physical Laboratory NPL.

Graphene Characterization Methods and Issues - The National Physical Laboratory (NPL) in the UK is arguably the most experienced and knowledgable institution in the world for the measurement and characterization of graphene and other 2D materials.

Dr. Andrew Pollard is the Science Area Leader of the Surface Technology Group and leads NPL's research into the structural and chemical characterisation of graphene and related 2D materials, with a focus on enabling industrial commercialisation in this area. This metrology research addresses the actual measurement of 2D materials with a range of surface characterisation techniques, such as Raman spectroscopy and tip-enhanced Raman spectroscopy (TERS), scanning probe microscopies (SPM), scanning electron microscopy (SEM), secondary ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS).

This webinar covers:

The NPL-Manchester good practice guide (GPG) on the characterisation of the structure of graphene and how it fits into current ISO standards.

Describe the methods contained in the GPG and the standards, including why to use them and briefly how they work.

An overview of the most commonly used characterization tools and methods, including SEM, TEM, AFM, Raman spectroscopy, BET (surface area).

Highlight other potential measurement methods including XRD, XPS, TGA, FTIR, ICP-MS.

Discuss the importance and the issues around quality control (QC) methods for understanding batch-to-batch variation in a production environment that are required by industry and the difference between quantitative and qualitative measurements