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Conducting Tip Atomic Force Microscopy: Pt 1 of 2
Автор: cmditr
Загружено: 2009-12-17
Просмотров: 22560
Описание:
Atomic Force Microscopy (AFM) is a well established process for visualizing ultrafine surface characteristics. In normal AFM scanning mode a fine needle is drawn very near a surface and is gently bent by the various atomic forces. The conducting tip gives you the chance to measure electrical conductivity at discrete locations and then correlate these measurement with the surface scan that reveals the shape.
This video is part one of a two-part series.
More information on the CMDITR wiki:
http://depts.washington.edu/cmditr/me...
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