Tyler McGrew - Effect of Parasitic Magnetic Couplings on EMI of GaN-Based PFC Converter
Автор: CPES VT
Загружено: 2025-07-09
Просмотров: 1166
Effect of Parasitic Magnetic Couplings on EMI of GaN-Based PFC Converter
Tyler McGrew was selected as the best presenter at the 2025 CPES Annual Conference in Technical Session 2: EMI Analysis and Mitigation.
Research Advisor: Qiang Li
Sponsors: CPES High Density Integration (HDI) and Power Management Consortium (PMC) mini-consortia.
Wide-bandgap power devices have enabled power supplies to increase in density while maintaining high efficiency. However, EMI issues remain one of the most challenging aspects when designing a power converter. These issues are often caused by parasitic near-field couplings which can degrade or bypass the attenuation of the EMI filter. This paper investigates how parasitic magnetic couplings impact the conducted noise of a high-frequency PFC converter using PCB-winding inductor. Analytical models are presented for both differential mode (DM) and common mode (CM) noise, including the effects of magnetic couplings between the PFC inductor and EMI filter. Then, three ferrite inductor core designs are evaluated to demonstrate how the core’s geometry and permeability affect its leakage magnetic field. Choosing the optimal core design is shown to significantly reduce the magnetic field outside the PFC inductor, which reduces DM noise by more than 20 dB and reduces CM noise by 7 dB.
KEY WORDS - Electromagnetic interference (EMI), PCB magnetics, integrated magnetics, high-frequency, near-field, parasitics
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