Challenges In Testing Photonics In Chips
Автор: Semiconductor Engineering
Загружено: 2025-11-21
Просмотров: 463
The semiconductor industry has spent decades improving reliability and consistency by standardizing when and how to test it, how to collect critical data from those tests, and what to do with that data. But electrical test data is very different from silicon photonics, which is being bundled into these SoCs and multi-die assemblies alongside traditional electrical components. Aftkhar Aslam, CEO of yieldWerx, talks with Semiconductor Engineering about the new challenges that photonics brings, including a lack of standards about what needs to be measured and how that should be done, what to do with multi-modal signatures that are no longer a single Gaussian distribution, and the overall impact on test time in the fab.
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