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Nanoscale IR Microscopy and Spectroscopy
Автор: NT-MDT Spectrum Instruments
Загружено: 2021-02-28
Просмотров: 641
Описание:
Scattering near-field infrared microscopy (s-SNOM IR) is a quite known technique that allows to break the diffraction limit by confining the light on the nanometer scale using a suitable probe and achieve down to 10 nm spatial resolution. In the meantime, it is less known that the key to successful s-SNOM IR is a high resolution and highly stable Atomic Force Microscope (AFM), which precisely controls the position of the probe and detects signals from it.
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