Nanotalks - New FIB lamella preparation process for in situ TEM
Автор: DENSsolutions
Загружено: 2020-06-18
Просмотров: 3478
In this Nanotalk, we will present our approach to the lamella sample preparation proces on DENSsolutions's Heating and Heating and Biasing Nano-Chips using our latest FIB stub 3.0.
Fore more information about our new FIB stub please visit: https://denssolutions.com/fib-stub-3-0/
Presentation content:
01:47 Introduction
08:23 New FIB stub 3.0
11:10 Sample preparation approach
16:47 Main challenges
21:46 Best practices
31:51 Examples
Q&A overview:
37:35 Vijay Bhatia - Sample attachment to stub.
40:20 Elena Macias-Sanchez - Chip compatibility.
46:07 Maria Varela - Mounting the lamella on the chip.
50:00 Justinas Palisaitis - Final sample milling.
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