Photonic Integrated Circuits Testing
Автор: Keysight Network & Data Center
Загружено: 2024-02-05
Просмотров: 2241
Verify photonic integrated circuits (PIC) designs on chip level for optical parameters insertion loss (IL), polarization dependent loss/gain (PDL / PDG), and optoelectronic S-parameters S21, S(l). Keysight and FormFactor collaborate to provide a complete solution for automated or manual probing and measurement automation.
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