MPI AST - Wafer-Level Wideband Modulated Characterization with 256QAM and less than 1% EVM
Автор: MPI AST
Загружено: 2025-02-24
Просмотров: 262
Join MPI Corporation and Keysight Technologies for an in-depth demonstration of advanced wafer-level wideband modulated characterization, featuring 256QAM modulation and an exceptional error vector magnitude (EVM) of less than 1%. This cutting-edge solution is designed to address the challenges of next-generation high-frequency communication systems, including RF, mmWave, and sub-THz applications.
What You’ll Learn in This Demo:
🔬 Advanced Measurement Capabilities with Keysight
• High-precision vector modulation and EVM analysis for accurate characterization of power amplifiers (PA) under real-world operating conditions.
• Seamless testing with low power input signals (as low as -25 dBm) without driving frequency extenders into compression, ensuring optimal dynamic range and signal integrity.
• Integration of a 6x local oscillator (LO) frequency multiplication system, delivering superior signal-to-noise ratio and minimizing conversion loss for accurate high-frequency measurements.
⚙️ Unmatched System Stability and Integration from MPI
• Industry-leading probe systems designed for exceptional mechanical stability and positioning accuracy, enabling repeatable, high-performance measurements across a wide frequency range.
• Seamless integration of MPI’s Frequency Extender Adaptation (FEAD) system and INT2 accessories, allowing for quick reconfiguration with minimal risk of equipment damage.
• Enhanced optical alignment systems for high-resolution DUT pad imaging, ensuring precise RF probe positioning and consistent data reproducibility.
💡 Demo Highlights:
• Wafer-level characterization with high modulation bandwidth and less than 1% EVM, critical for next-generation communications such as 5G, 6G, and beyond.
• Real-time demonstration using Keysight’s PNA-X Microwave Network Analyzer and VDI frequency extenders, fully integrated with MPI’s automated probe systems.
• Showcasing TITAN™ Multi-Contact Probes (MCP), providing consistent contact, low-loss performance, and high-power handling for cutting-edge mmWave testing.
🚀 Why It Matters:
As the demand for higher-speed, low-latency communication systems grows, engineers face increasing challenges in characterizing advanced broadband power amplifiers and RF circuits. This joint solution between MPI Corporation and Keysight Technologies simplifies complex measurements and enhances system stability, delivering reliable, high-precision data critical for accelerating next-generation technology development.
🔗 Explore More About Our Technologies:
• MPI RF & mmWave Solutions: https://www.mpi-corporation.com/ast/a...
• Keysight Technologies: https://www.keysight.com
#EuMW2024 #KeysightTechnologies #MPICorporation #256QAM #RFTesting #mmWave #NextGenCommunication #Dband #WaferLevelCharacterization #SemiconductorTesting #EVM
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