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Residual Stress with XRD
Автор: Bruker
Загружено: 2024-04-24
Просмотров: 8605
Описание:
Residual stress remains in a component once the active force is removed. It originates from microscopic deformation of the crystallites that make up a material. X-ray diffraction is often used to measure this residual stress allowing minimization of undesirable stress conditions to optimize a materials performance. In this video we discuss the origins of residual stress and its measurement and analysis with X-ray diffraction.
Chapters:
00:00 Introduction
00:30 What is stress?
01:38 How is residual stress measured?
02:05 Residual stress analysis
03:01 Conclusion
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