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TESLA - Power Device Characterization System | FormFactor
Автор: FormFactor Inc.
Загружено: 2015-02-05
Просмотров: 8972
Описание:
The Tesla semi-automatic power device characterization system provides a complete on-wafer solution for over-temperature, low-contact resistance measurements of power semiconductors up to 3,000 V (triax)/10,000 V (coax) and 200 A (pulsed)/10 A (DC), while providing a low-noise, fully guarded and shielded test environment, as well an infrared laser light curtain and safety interlock system.
#PowerDeviceCharacterization #ProbeSystem
Learn more: https://www.formfactor.com/products/p...
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