Zeiss EVO SEM EDS Part 1: Point & ID
Автор: Sydney Microscopy & Microanalysis
Загружено: 2021-10-12
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Zeiss EVO SEM EDS Part 1: Point & ID
Oxford Instruments AZtec EDS system, with large area X-Max 80mm2 silicon drift EDS detector
Fully automated analytical capability with particle detection ("Feature"), large area imaging and EDS map montaging. Ideal for automated detection of inclusions in steel, heavy minerals in rocks and particle classification in engineering applications.
Zeiss EVO SEM: Basic Operation ( • Zeiss EVO Scanning Electron Microscope )
Zeiss EVO SEM EDS Part 2: Map ( • Zeiss EVO SEM EDS Part 2: Map )
Zeiss EVO SEM EDS Part 3: Saving Data ( • Zeiss EVO SEM EDS Part 3: Saving Data )
Australian Centre for Microscopy & Microanalysis
http://sydney.edu.au/acmm
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