How to subtract instrumental broadening (βi) from XRD data using origin

#XRDDataAnalysis #InstrumentalBroadening #OriginLabTutorials
0:10 what is instrumental broadening (βi) in XRD data
2:25 what factors contribute to the instrumental broadening in XRD data
3:00 X-ray machine optics cause instrumental broadening in XRD data
6:20 how to subtract instrumental broadening from XRD
8:10 how instrumental broadening affect XRD parameters

Origin and Excel Files:
https://drive.google.com/file/d/1Bqv1...

In this video tutorial, you will learn how to subtract instrumental broadening (βi) from XRD data using Origin. Instrumental broadening is a common issue in XRD data that can affect the accuracy and precision of your results. By subtracting the instrumental broadening, you can obtain more reliable data and improve the quality of your XRD analysis. In this tutorial, we will take you step-by-step through the process of subtracting the instrumental broadening using Origin, a powerful data analysis software. We will cover all the essential tools and techniques required to perform this analysis, including data manipulation, curve fitting, and data visualization. By the end of this tutorial, you will have a solid understanding of how to subtract instrumental broadening from XRD data using Origin.

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References:
http://prism.mit.edu/xray

Article References
https://link.springer.com/article/10....
D. Balzar, N. Audebrand, M. Daymond, A. Fitch, A. Hewat, J.I. Langford, A. Le Bail, D. Louër, O. Masson, C.N. McCowan, N.C. Popa, P.W. Stephens, B. Toby, “Size-Strain Line-Broadening Analysis of the Ceria Round-Robin Sample”, Journal of Applied Crystallography 37 (2004) 911-924
•S Enzo, G Fagherazzi, A Benedetti, S Polizzi,
–“A Profile-Fitting Procedure for Analysis of Broadened X-ray Diffraction Peaks: I. Methodology,” J. Appl. Cryst. (1988) 21, 536-542.
–“A Profile-Fitting Procedure for Analysis of Broadened X-ray Diffraction Peaks. II. Application and Discussion of the Methodology” J. Appl. Cryst. (1988) 21, 543-549
•B Marinkovic, R de Avillez, A Saavedra, FCR Assunção, “A Comparison between the Warren-Averbach Method and Alternate Methods for X-Ray Diffraction Microstructure Analysis of Polycrystalline Specimens”, Materials Research 4 (2) 71-76, 2001.
•D Lou, N Audebrand, “Profile Fitting and Diffraction Line-Broadening Analysis,” Advances in X-ray Diffraction 41, 1997.
•A Leineweber, EJ Mittemeijer, “Anisotropic microstrain broadening due to compositional inhomogeneities and its parametrisation”, Z. Kristallogr. Suppl. 23 (2006) 117-122
•BR York, “New X-ray Diffraction Line Profile Function Based on Crystallite Size and Strain Distributions Determined from Mean Field Theory and Statistical Mechanics”, Advances in X-ray Diffraction 41, 1997.