Autonomous metrology: Part 2, feat ETQ's Jamie Fernandez & John Taylor
Автор: Quality Digest
Загружено: 2023-10-03
Просмотров: 142
We interviewed Jamie Fernandez, chief product officer for ETQ, and John Taylor, chief technology officer at ETQ, about the connection between quality management system software and autonomous metrology. How does integrating the two play into predictive quality and closed-loop manufacturing?
Filmed at the HxGN LIVE user conference in Las Vegas.
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