Center for Electron Microscopy and Analysis
The Ohio State University's Center for Electron Microscopy and Analysis (CEMAS) is a centralized, coordinated imaging facility where traditional boundaries between disciplines are eliminated.
With one of the largest concentrations of electron and ion beam analytical microscopy instruments in any North American institution, CEMAS brings together multidisciplinary expertise to drive synergy, amplify characterization capabilities, and challenge what is possible in analytical electron microscopy.
Integrating nanoscopy into a biology toolbox: A case for high-throughput imaging and image analysis
In-Situ TEM Holders
Investigating Dislocation Behavior in Additively Manufactured Nickel Aluminum Bronze
Cells at CEMAS
In Situ SEM Nanomechanical Testing – Advances in Extreme Temperature Testing and Automation
Utilizing electron microscopy to understand the effect of the environment on fracture of metals
X-ray Photoelectron Spectroscopy at the Ohio State Surface Analysis Laboratory
Using microCT in Conjunction with Electron Microscopy
Multi-scale characterization of 3D printable ODS-MPEAs by cross-correlation of advanced STEM methods
EBSD – Transforming Kikuchi Patterns into Useful Data
Low Voltage SEM Imaging for Micro/Nanoelectronics Process Development and Troubleshooting
Using cryoSPARC (v4) to Analyze Negative Stain Data
Getting Started with Cyro-EM
Microscopy Vacuum Systems: Nothing to it
Careers in Microscopy and How MSA Can Help You Get One
Compositional Analysis at the Microscale with EDS and WDS
Diffraction in the TEM
Sample Preparation of Inorganic Materials for Electron Microscopy
Making the Most of Your Glacios Time
Cryo-EM and the FIB
The Brave New World of meV EELS in the Electron Microscope
Resins for Embedding Biological Samples for Electron Microscopy Examination
Large Area Analysis in the SEM
Novel Light Microscopy Technologies in Scientific Research
Overview of CEMAS' Aberration Corrected TItan TEM and Themis-Z (S)TEM
Getting Started with Cryo-EM at CEMAS
How to Mount Samples for microCT Scanning
EDX Analysis in the S/TEM
SEM Limbo: How Low Can You Go?