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Introduction to On-wafer Measurement of IC
Автор: Tensorbundle
Загружено: 2018-11-10
Просмотров: 5281
Описание:
This short talk and instrumental demonstration introduce the on-wafer measurement of ICs. The instruments like probe station, GSG probes, DC probes etc. are shown. The concept of on-wafer testing is shortly discussed.
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