On wafer device characterization | Philips Engineering Solutions
Автор: Philips Engineering Solutions
Загружено: 2015-06-29
Просмотров: 4209
Increasingly complex high-speed IC chips operating at very high frequency demand state-of-the-art RF characterization. This on-wafer device characterization service is provided by our Electronic Measurement Lab, utilizing an RF Probe Station with independent probes for free coordinate setting, ideal for irregularly formed devices. Based on the high-performance 4 port Microwave PNA network analyzer, we offer state-of-the-art on-wafer performance up to 67 GHz, ultra low level CV and IV measurements, and multi-purpose probing. We can perform the measurements for you. Furthermore, you can log in to connect with our specialists, via our Virtual Lab functionality, and follow the real-time measurements remotely from your location.
Are you active in the RF business, like in radar, RF power, communication, wireless connectivity, or RF testing? Are you developing products for high-frequency applications and striving for excellent performance and quality?
Learn more about our service: https://www.engineeringsolutions.phil...
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