ImageJ - Scanning Electron Microscope (SEM) (Advanced) - Particle Size Analysis | AMC-Tec |
Автор: AMC-Tec
Загружено: 2020-07-07
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Scanning Electron Microscope (SEM) Image Analysis (Advanced) - Particle Size Analysis using the Threshold function of ImageJ software.
AMC-Tec | Video #002
Key point
Setting up the scale
Use of Analyse particle function
Use of Threshold to distinguish particles
Use of FFT Bandpass filter
How to select optimum threshold value
ImageJ software
https://drive.google.com/file/d/1p4aw...
SEM Examples
https://drive.google.com/file/d/1xuiL...
ResearchGate: https://www.researchgate.net/profile/...
Facebook: / advancedmaterialscharacterizationtechniques
Advanced Materials Research Laboratory
Department of Physics
Faculty of Science
University of Peradeniya
Sri Lanka
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