AMC-Tec
Advanced Materials Characterization Techniques (AMC-Tec).
We are from the Advanced Materials Research Laboratory (AMReL), University of Peradeniya, Sri Lanka, which mainly engaged with research based on thin film solar cells, gas sensors and value addition to the natural graphite. In this channel, we demonstrate advanced thin film deposition techniques, characterization techniques and solar cell fabrication techniques.
Additionally, we discuss advanced analysis techniques using specific software.
Contact
Dr. Isuru Lakmal
[email protected]
How to Determine the Bandgap of Semiconductor Thin Films Using UV-Vis Spectroscopy
Particle Size Analysis with ANALYSETTE 22 NanoTec | Wet & Dry Dispersion Methods
Measuring Contact Angles Using LB-ADSA in ImageJ | Drop Analysis Tutorial
ImageJ Tutorial: Determining Atomic Plane Distances in HR-TEM Images with FFT function
Installation of the Compact UMC Stage on the Bruker D8 ADVANCE Eco XRD Machine - AMC-Tec
Basic Operation of FTIR Machine - Bruker Tensor 27
Close-spaced Sublimation (CSS) Process - Advanced Materials Research Laboratory (AMReL) - AMC-Tec
Prototype Manufacturing of Solar Panels with Demonstrations
XRD Operation Procedure - Part 2 - Rotational Powder Sample Stage Installation
Portable Solar Simulator PEC L01 | AMC-Tec
XRD Operation Procedure - Part 1 - XYZ Sample Stage Removal for Powder Sample Stage Installation
Vacuum Thermal Evaporation Systems - Advanced Materials Research Laboratory (AMReL) - AMC-Tec
Advanced Materials Research Laboratory - University of Peradeniya - Sri Lanka
ImageJ - Scanning Electron Microscope (SEM) (Advanced) - Particle Size Analysis | AMC-Tec | #002
Advanced Materials Characterization Techniques - (AMC - Tec)
ImageJ - Scanning Electron Microscope (SEM) Image Analysis (Basic) - Particle Size | AMC-Tec | #001