ImageJ Tutorial: Determining Atomic Plane Distances in HR-TEM Images with FFT function

Example TEM images:
https://drive.google.com/file/d/1VKrY...

Welcome to the “AMC-Tec” video series! In this tutorial, I demonstrate how to use the Fast Fourier Transform (FFT) function in ImageJ software to accurately measure the distances between atomic planes in high-resolution transmission electron microscopy (HR-TEM) images.

The video begins with an introduction to TEM images and highlights the challenges posed by background noise during atomic plane analysis. Using ImageJ, I walk you through the process of visualizing atomic planes and analyzing line profiles to evaluate periodic information. I explain how background noise can cause inconsistencies in measurements and show how the FFT function helps remove noise while preserving atomic plane details.

The step-by-step guide includes:

Setting Up the Scale: Learn how to calibrate ImageJ for precise measurements.
Fourier Transformation: Discover how to generate a Fourier-transformed image and interpret frequency-domain information, including the identification of bright spots representing repeating dimensions.
Determining Plane Distances: Understand how to extract the "r" value from the status bar, representing the atomic plane distance in nanometers, and conclude the process here if no further analysis is needed.
Enhancing for Publications: Follow additional steps to isolate bright spots in the Fourier image, apply threshold adjustments, and perform an inverse FFT to produce a noise-free image, ideal for publications.
The video also includes a practical demonstration of measuring atomic plane distances using line profiles. By drawing a line perpendicular to the planes and calculating peak intervals, I verify the uniformity of the transformed image and determine an accurate distance of approximately 0.2 nm between atomic planes.

Whether you’re a student, researcher, or materials scientist, this tutorial provides essential insights into analyzing HR-TEM images using ImageJ. Perfect for enhancing your skills in electron microscopy image analysis, this video combines theoretical concepts with hands-on techniques to ensure accurate results for your research or publications.

Feel free to drop your questions in the comments section, and don’t forget to check out other videos in the “AMC-Tec” series for more ImageJ tutorials and microscopy tips. Thank you for watching!

#ImageJ
#HR-TEM
#High-resolution transmission electron microscopy
#FFT
#Fourier_transform
#Atomic plane distance measurement
#TEM