Why series collection with drift-corrected frame integration (DCFI) produces superior STEM images
Автор: Nicholas Rudawski
Загружено: 2025-09-08
Просмотров: 245
Hey EM aficionados! I'm back at you with another video talking about the benefits of short dwell time series collection with drift-corrected frame integration (DCFI) for atomic-resolution STEM imaging compared to the (historically) more typical approach of imaging with a single pass using a (relatively) long dwell time.
Thank you for your support, my fellow EM aficionados, as we have now surpassed 5,000 subscribers! Please like, subscribe, and share and leave any questions or comments you may have and I will do my best to reply as soon as possible. Video topic requests are always welcome and appreciated; I enjoy making these videos and wish I could make them more frequently, but the demands of my job make it tough to do so; I’m in charge of three S/TEMs, three dual FIB/SEM systems (a new one recently signed off on), and half of an SEM and this keeps me very busy!
Connect with me on LinkedIn: / nicholas-rudawski-30414528
Where I work: https://nrf.aux.eng.ufl.edu/
E-mail me directly: ngr@ufl.edu
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