Testing and Testability||Combinational ATPG||Boolean Difference Method||VLSI Testing||DFT||JNTUH

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In this Video I had Explained Boolean Difference Method along with most Important Solved Problems
||Combinational Automatic Test Pattern Generation(ATPG)||Combinational Testing|| CMOS IC Testing|| Digital VLSI Testing
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1. An Introduction to VLSI Design:    • An Introduction to VLSI Design|| IC Fabric...  
2. Basic Electrical Properties of MOS& BI-CMOS Circuits:    • Basic Electrical Properties of MOS& BI-CMO...  
3. MOS Inverters and their Configurations:    • MOS Inverters and their Configurations||VL...  
4. Basic Circuit Concepts in VLSI Design PART-1:    • Basic Circuit Concepts in VLSI Design|Shee...  
5. Basic Circuit Concepts in VLSI Design PART-2:    • Basic Circuit Concepts in VLSI Design|| Ro...  
6. Basic Circuit Concepts in VLSI Design PART-3:    • Basic Circuit Concepts in VLSI Design|| Dr...  
7. VLSI PHYSICAL DESIGN:    • VLSI  Physical Design||Floor Planning, Pla...  
8. FULL CUSTOM&SEMI CUSTOM DESIGN STYLES IN VLSI:    • Full Custom and semi custom design styles ...  
9. VLSI Design Styles:(Programmable Logic Devices):    • Programmable Logic Devices|| VLSI DESIGN S...  
10. VLSI Gate Level Design PART_1:    • VLSI GATE LEVEL DESIGN PART-1||VLSI DESIGN...  
11. VLSI Gate Level Design PART_2:    • VLSI  GATE LEVEL DESIGN PART -2||Alternati...  
12.VLSI TESTING AND TESTABILITY PART -1 :    • VLSI Testing &Testability||CMOS IC Testing...  
13.VLSI TESTING AND TESTABILITY PART-2 :    • VLSI Testing &Testability||CMOS IC Testing...  
14. Boolean Difference Method:    • Testing and Testability||Combinational ATP...