Spectroscopy In Action : Semiconductors Advanced Spectroscopic Characterisation
Автор: Edinburgh Instruments
Загружено: 2025-09-25
Просмотров: 376
Join Dr Matthew Berry for an in-depth look at how multimodal microscopy is driving progress in both research and industry applications. This webinar will highlight the power of combining Raman, photoluminescence (PL), and fluorescence lifetime imaging microscopy (FLIM) techniques to deliver comprehensive insights into semiconductor and photovoltaic materials.
We’ll walk through a series of case studies that demonstrate the versatility of multimodal imaging, including:
• Simultaneous Raman and PL imaging in silicon wafers
• Doping, polytype, and defect mapping in SiC power electronics
• Correlated Raman/PL imaging of GaN LEDs
• Carrier dynamics in perovskites using FLIM
• Correlated Raman, PL, and photocurrent imaging in organic solar cells
• Full-wafer analysis for uniformity and process control
Whether you’re focused on developing advanced semiconductors, optimising photovoltaic devices, or improving process reliability, this webinar will show how multimodal microscopy streamlines workflows and provides unparalleled insight into material properties and performance.
To find out more about semiconductor characterisation:
https://www.edinst.com/blog/advanced-...
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