FEI Tecnai F20 S/TEM: 2-beam imaging

Автор: Nicholas Rudawski

Загружено: 2018-10-15

Просмотров: 12453

Описание:

This is a demonstration of the operation of an FEI Tecnai F20 scanning/transmission electron microscope by Dr. Nicholas Rudawski of the University of Florida; this demonstration covers 2-beam imaging in TEM (conventional) mode including:

1. Basic considerations for 2-beam imaging
2. Setting up a 2-beam condition
3. Bright-field imaging from a 2-beam condition
4. Centered (axial) dark-field imaging from a 2-beam condition
5. Weak-beam dark-field imaging from a 2-beam condition

FEI Tecnai F20 S/TEM: 2-beam imaging

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